Cryo Focused Ion Beam Milling

FIB technology can help you prepare samples for a variety of imaging techniques, including cryo-electron tomography (cryo-ET), microcrystal electron diffraction (microED), and volume electron microscopy (vEM). When using focused ion beam (FIB) milling under cryogenic conditions, an ion beam is directed onto the surface of the frozen-hydrated sample to precisely remove material. FIB technology can produce thin, electron-transparent cryo-lamellae samples for imaging on a cryo-transmission electron microscope (TEM).

Thermo Scientific DualBeam Focused Ion Beam Scanning Electron Microscopes (FIB-SEMs) are equipped with an additional scanning electron beam, allowing them to be used for three-dimensional serial imaging in addition to their lamella preparation capabilities. The principle of 3D imaging is based on ablation of the sample with the ion beam and imaging of the freshly generated surfaces with the electron beam. This sequential form of 3D imaging is also known as the "slice-and-view" technique and can be used under cryogenic conditions or at room temperature. FIB technology supports life sciences research, including structural and cell biology, by visualizing macromolecular structures in near-native state.

Cryo focused ion beam applications

FIB microscopes can be used for a range of applications, including sample preparation for transmission electron microscopy as well as subsurface characterization and 3D visualization.

Cryo-FIB instruments and workflows

Explore a broad portfolio of workflow solutions and advanced automation capabilities to unlock structural insights.